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FT-CCD的纳秒脉冲激光毁伤效应

张震 徐作冬 程德艳 师宇斌 张检民

张震, 徐作冬, 程德艳, 师宇斌, 张检民. FT-CCD的纳秒脉冲激光毁伤效应[J]. 红外与激光工程, 2017, 46(10): 1003001-1003001(5). doi: 10.3788/IRLA201746.1003001
引用本文: 张震, 徐作冬, 程德艳, 师宇斌, 张检民. FT-CCD的纳秒脉冲激光毁伤效应[J]. 红外与激光工程, 2017, 46(10): 1003001-1003001(5). doi: 10.3788/IRLA201746.1003001
Zhang Zhen, Xu Zuodong, Chen Deyan, Shi Yubin, Zhang Jianmin. Effect of FT-CCD damaged by nanosecond pulse laser[J]. Infrared and Laser Engineering, 2017, 46(10): 1003001-1003001(5). doi: 10.3788/IRLA201746.1003001
Citation: Zhang Zhen, Xu Zuodong, Chen Deyan, Shi Yubin, Zhang Jianmin. Effect of FT-CCD damaged by nanosecond pulse laser[J]. Infrared and Laser Engineering, 2017, 46(10): 1003001-1003001(5). doi: 10.3788/IRLA201746.1003001

FT-CCD的纳秒脉冲激光毁伤效应

doi: 10.3788/IRLA201746.1003001
基金项目: 

国家自然科学基金(11405132)

详细信息
    作者简介:

    张震(1981-),男,副研究员,博士,主要从事光电器件与系统激光辐照效应方面的研究。Email:zhangzhen11@nint.ac.cn

  • 中图分类号: TN249

Effect of FT-CCD damaged by nanosecond pulse laser

  • 摘要: 用1 064 nm波长8 ns脉宽激光,以1-on-1模式辐照在评估板驱动工作下的FT50M型FT-CCD图像传感器进行实验。结果显示,随着脉冲能量密度的逐渐提高,在FT-CCD输出图像中依次出现辐照点单侧黑线、白点、两侧白线等典型毁伤现象。这区别于IT-CCD在脉冲激光辐照下依次出现白点、白线的毁伤过程。通过对比FT-CCD与IT-CCD的结构异同,结合已知的IT-CCD的毁伤机制,分析认为单侧黑线毁伤现象的首先出现表明了FT-CCD多晶硅电极先于硅衬底受损的激光毁伤模式。文中丰富了对CCD图像传感器激光毁伤效应的认识,为深入探索CCD激光毁伤机制提供了新的线索。
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  • 收稿日期:  2017-08-31
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FT-CCD的纳秒脉冲激光毁伤效应

doi: 10.3788/IRLA201746.1003001
    作者简介:

    张震(1981-),男,副研究员,博士,主要从事光电器件与系统激光辐照效应方面的研究。Email:zhangzhen11@nint.ac.cn

基金项目:

国家自然科学基金(11405132)

  • 中图分类号: TN249

摘要: 用1 064 nm波长8 ns脉宽激光,以1-on-1模式辐照在评估板驱动工作下的FT50M型FT-CCD图像传感器进行实验。结果显示,随着脉冲能量密度的逐渐提高,在FT-CCD输出图像中依次出现辐照点单侧黑线、白点、两侧白线等典型毁伤现象。这区别于IT-CCD在脉冲激光辐照下依次出现白点、白线的毁伤过程。通过对比FT-CCD与IT-CCD的结构异同,结合已知的IT-CCD的毁伤机制,分析认为单侧黑线毁伤现象的首先出现表明了FT-CCD多晶硅电极先于硅衬底受损的激光毁伤模式。文中丰富了对CCD图像传感器激光毁伤效应的认识,为深入探索CCD激光毁伤机制提供了新的线索。

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