[1] |
Dvck R H, Steffe W. Effects of optical crosstalk in CCD image sensors[C]//Proc 5th Int. Conf. on Application of Charge-Coupled Devices, 1978. |
[2] |
Lavine J P, Chang W C, Anagnostopoulos C N. Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006, 4(4):531-535. |
[3] |
Machet N, Kubert-Habart C, Baudinud V. Study of the mechanism of electronic diffusion in a CCD camera subject to intense laser illumination[C]//RADECS:1997, 97:417-423. |
[4] |
Zhen Z, The experimental study on the irradiation effects of visible light CCD[D]. Changsha:National University of Defense Technology, 2005. (in Chinese) |
[5] |
Ke S, Liangjin H, Xiang'ai C, et al. Analysis and simulation of the phenomenon of secondary spots of the TDI CCD camera irradiated by CW laser[J]. Opt Exp, 2011, 19:23901. |
[6] |
Weicheng Q, Rui W, Zhongjie X, et al, Study on the light response characteristics of PV HgCdTe linear array detector with CTIA circuit[J]. Infrared and Laser Engineering, 2013, 42(6):1394-1398. (in Chinese) |
[7] |
Tian J, Xiang'ai C, Xin Z, et al. The over-saturation phenomenon of a Hg0.46Cd0.54Te photovoltaic detector irradiated by a CW laser[J]. Semiconductor Science and Technology, 2011, 26:115004. |
[8] |
Tian J, Xin Z, Xiang'ai C, et al, The carrier transportation of photoconductive HgCdTe detector irradiated by CW band-off laser[J]. J Infrared Millim Waves, 2012, 31(3):1-6. |
[9] |
Ke S, Houman J, Xiang'ai C. Distribution of in-field stray light due to surface scattering from primary mirror illuminated by intense light[J]. Optics and Precision Engineering, 2011, 19(2):493-499. (in Chinese) |
[10] |
Scharfetter D L, Gummel H K. Large signal analysis of a silicon read diode[J]. IEEE Trans Electron Dev, 1969, 16:64-77. |