[1] Schmit J, Creath K, Wyant J C. Surface Profilers, Multiple Wavelength, and White Light Interferometry [M]. 3rd ed. US: Wiley, 2007: 667–755.
[2] de Groot P. Principles of interference microscopy for the measurement of surface topography [J]. Advanced Optics Photonics, 2015, 7(1): 1-65.
[3] Sandoz P. An algorithm for profilometry by white-light phase shifting interferometry [J]. Journal of Modern Optics, 1996, 43(8): 1545-1554.
[4] Larkin K G. Efficient nonlinear algorithm for envelope detection in white light interferometry [J]. Journal of Optical Society of America A, 1996, 13(4): 832-843. doi:  10.1364/JOSAA.13.000832
[5] Ma S, Quan C, Zhu R, et al. Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry [J]. Optics Communications, 2011, 284(10): 2488-2493.
[6] de Groot P, Deck L. Surface profiling by analysis of white-light interferograms in the spatial frequency domain [J]. Journal of Modern Optics, 1995, 42(2): 389-401. doi:  10.1080/09500349514550341
[7] Wang J, Chen L. Measurement of micro-displacement using white-light interference based on a spatial frequency domain algorithm [J]. Infrared and Laser Engineering, 2008, 37(5): 874-877. (in Chinese)
[8] Deng Q, Tang Y, Zhou Y, et al. High-resolution surface topography measurement based on frequency-domain analysis in white light interferometry [J]. Chinese Journal of Lasers, 2018, 45(6): 0604001. (in Chinese) doi:  10.3788/CJL201845.0604001
[9] Montgomery P C, Salzenstein F, Montaner D, et al. Implementation of a fringe visibility based algorithm in coherence scanning interferometry for surface roughness measurement [C]//Proc SPIE, 2013, 8788: 87883G.
[10] Han Z, Chen L. Eight-step phase shifting alorithm for broadband light interferometry insensitive to envelop variation and phase shifitng error [J]. Infrared and Laser Engineering, 2015, 44(4): 1236-1242. (in Chinese)
[11] Dong Chen. High-definition vertical-scan interferometry, US: US11473447[P].2006-06-23.
[12] Creath K. Calibration of numerical aperture effects in interferometric microscope objectives [J]. Applied Optics, 1989, 28(15): 3333-3338.
[13] Sheppard C J R, Larkin K G. Effect of numerical aperture on interference fringe spacing [J]. Applied Optics, 1995, 34(22): 4731-4734. doi:  10.1364/AO.34.004731
[14] Dubois A, Selb J, Vabre L, et al. Phase measurements with wide-aperture interferometers [J]. Applied Optics, 2000, 39(14): 2326-2331. doi:  10.1364/AO.39.002326
[15] de Groot P. Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window [J]. Applied Optics, 1995, 34(22): 4723-4730.
[16] Phillion D W. General methods for generation phase-shifting interferometry algorithms [J]. Applied Optics, 1997, 36(31): 8098-8115. doi:  10.1364/AO.36.008098