[1] Liu Z C, Zheng Y, Pan F, et al. Investigation of laser induced damage threshold measurement with single-shot on thin films [J]. Applied Surface Science, 2016, 382: 294-301. doi:  10.1016/j.apsusc.2016.04.093
[2] Demons S G, Staggs M, Minoshima K, et al. Characterization of laser induced damage sites in optical components [J]. Optics Express, 2002, 10(25): 1444-1450. doi:  10.1364/OE.10.001444
[3] Du Y, Liu S, He H, et al. Laser-induced damage properties of antireflective porous glasses [J]. Opt Commun, 2012, 285: 5512-5518. doi:  10.1016/j.optcom.2012.07.120
[4] Jiao H F, Cheng X B, Lu J T, et al. Study for improvement of laser induced damage of 1064 nm AR coatings in nanosecond pulse [J]. Journal of the Optical Society of Korea, 2013, 17(1): 1-4. doi:  10.3807/JOSK.2013.17.1.001
[5] DiJon J, Poiroux T, Desrumaux C. Nano absorbing centers: a key point in the laser damage of thin films[C]// Proc SPIE, 1997: 315-325.
[6] Cheng X, Wang Z. Defect-related properties of optical coatings [J]. Advanced Optical Technologies, 2014, 3: 65-90.
[7] Cheng X, Shen Z, Jiao H, et al. Laser damage study of nodules in electron-beam evaporated HfO2/SiO2 high reflectors [J]. Appl Opt, 2011, 50: C357-C363. doi:  10.1364/AO.50.00C357
[8] Zhang Longxia, Zhu Xiaobing, Li Fengyu, et al. Laser-induced thermal damage influenced by surface defects of materials [J]. Acta Optica Sinica, 2016, 36(9): 0914001-7. (in Chinese)
[9] Papernov S, Schmid A W. Testing asymmetry in plasma-ball growth seeded by a nanoscale absorbing defect embedded in a SiO2 thin-film matrix subjected to UV pulsed-laser radiation [J]. Journal of Applied Physics, 2008, 104(6): 063101. doi:  10.1063/1.2980054
[10] Papernova S, Schmid A W. Two mechanisms of crater formation in ultraviolet-pulsed-laser irradiated SiO2 thin films with artificial defects [J]. Journal of Applied Physics, 2005, 97: 114906. doi:  10.1063/1.1924878
[11] Carr C W, Radousky H B, Rubenchik A M, et al. Localized dynamics during laser-induced damage in optical materials [J]. Physical Review Letters, 2004, 92(8): 087401. doi:  10.1103/PhysRevLett.92.087401
[12] Papernova S, Schmid A W. Correlations between embedded single gold nanoparticles in SiO2 thin film and nanoscale crater formation induced by pulsed-laser radiation [J]. Journal of Applied Physics, 2002, 92: 5720-5728. doi:  10.1063/1.1512691
[13] Xia Z L, Fan Z X, Shao J D. Statistical approach to bulk inclusion initialized damage in films [J]. Optics Communications, 2006, 265(2): 620-627. doi:  10.1016/j.optcom.2006.04.073
[14] Zhu Z, Cheng X, Huang L, et al. Light field intensifification induced by nanoinclusions in optical thin-films [J]. Applied Surface Science, 2012, 258(12): 5126-5130. doi:  10.1016/j.apsusc.2012.01.145