[1] Adell P C, Schrimpf R D, Holman W T, et al. Total-dose and single-event effects in DC/DC converter control circuitry [J]. IEEE Transactions on Nuclear Science, 2003, 50(6): 1867-1872. doi:  10.1109/TNS.2003.820757
[2] Adell P C, Schrimpf R D, Choi B K, et al. Total-dose and single-event effects in switching DC/DC power converters [J]. IEEE Transactions on Nuclear Science, 2002, 49(6): 3217-3221. doi:  10.1109/TNS.2002.805425
[3] 张昊, 王新升, 李博, 等. 微小卫星单粒子闩锁防护技术研究[J]. 红外与激光工程, 2015, 44(5): 1444-1149. doi:  10.3969/j.issn.1007-2276.2015.05.009

Zhang Hao, Wang Xinsheng, Li Bo, et al. Research on Single Event Latchup protection technology for micro-satellite [J]. Infrared and Laser Engineering, 2015, 44(5): 1444-1149. (in Chinese) doi:  10.3969/j.issn.1007-2276.2015.05.009
[4] Buchner S, McMorrow D, Sternberg A, et al. Single-event transient characterization of an LM119 voltage comparator: An approach to SET model validation using a pulsed laser [J]. IEEE Transactions on Nuclear Science, 2002, 49(3): 1502-1508. doi:  10.1109/TNS.2002.1039691
[5] Chugg A M, Jones R, Moutrie M J, et al. Laser simulation of single event effects in pulse width modulators [J]. IEEE Transactions on Nuclear Science, 2005, 52(6): V2487-2494. doi:  10.1109/TNS.2005.860721
[6] 姜昱光, 封国强, 朱翔, 等. FPGA单粒子效应的脉冲激光试验方法研究[J]. 原子能科学技术, 2012, 46(9): 582-586.

Jiang Yuguang, Feng Guoqiang, Zhu Xiang, et al. PuIsed laser method for see testing in FPGAs [J]. Atomic Energy Science and Technology, 2012, 46(9): 582-586. (in Chinese)
[7] Buchner S, Howard Jr J, Poivey C, et al. Pulsed-laser testing methodology for single event transients in linear devices [J]. IEEE Transactions on Nuclear Science, 2004, 51(6): 3716-3722. doi:  10.1109/TNS.2004.839263
[8] 曹洲, 薛玉雄, 杨世宇, 等. 单粒子效应激光模拟试验技术研究[J]. 真空与低温, 2006, 12(3): 166-172. doi:  10.3969/j.issn.1006-7086.2006.03.010

Cao Zhou, Xue Yuxiong, Yang Shiyu, et al. Laser simulation of single event effects [J]. Vacuum and Cryogenics, 2006, 12(3): 166-172. (in Chinese) doi:  10.3969/j.issn.1006-7086.2006.03.010
[9] Pease R L, Sternberg A L, Boulghassoul Y, et al. Comparison of SET’s in bipolar linear circuits generated with an ion microbeam, laser light and circuit simulation [J]. IEEE Transactions on Nuclear Science, 2002, 49(6): 3163-3170. doi:  10.1109/TNS.2002.805346
[10] 王德坤, 曹洲, 刘海南, 等. 脉冲激光背照射单粒子效应实验研究[J]. 原子能科学技术, 2011, 45(7): 884-887.

Wang Dekun, Cao Zhou, Liu Hainan, et al. Backside piuse laser testing for single event effect [J]. Atomic Energy Science and Technology, 2011, 45(7): 884-887. (in Chinese)
[11] 赵雯, 郭红霞, 张凤祁, 等. 脉宽调制器单粒子效应测试系统研制[J]. 原子能科学技术, 2014, 48: 717-722.

Zhao Wen, Guo Hongxia, Zhang Fengqi, et al. Development of measurement system for single event effect on pulse width modulator [J]. Atomic Energy Science and Technology, 2014, 48: 717-722. (in Chinese)
[12] 曹洲, 薛玉雄, 田恺, 等. 脉冲激光在电子设备加固评估中的应用[J]. 空间电子技术, 2015(3): 81-87. doi:  10.3969/j.issn.1674-7135.2015.03.014

Cao Zhou, Xue Yuxiong, Tian Kai, et al. The utility of pulsed laser system in the evaluation of hardening design for electronic device [J]. Space Electronic Technology, 2015(3): 81-87. (in Chinese) doi:  10.3969/j.issn.1674-7135.2015.03.014
[13] Chen D, Buchner S, Phan A, et al. The effects of elevated temperature on pulsed-laser induced single event transients in analog devices [J]. IEEE Transactions on Nuclear Science, 2009, 56(6): 3138-3140. doi:  10.1109/TNS.2009.2032763
[14] Larsson S, Mattsson S. Heavy ion effects in PWM’s of the types UCC1806 and UC1825A[R]. ESA_QCA0417S_C, 2005.
[15] 安恒, 张晨光, 杨生胜, 等. SiGeBiCMOS线性器件脉冲激光单粒子瞬态效应研究[J]. 红外与激光工程, 2019, 48(3): 0320001. doi:  10.3788/IRLA201948.0320001

An Heng, Zhang Chenguang, Yang Shengsheng, et al. Investigation of single event transients on SiGe BiCMOS linear devices with pulsed laser [J]. Infrared and Laser Engineering, 2019, 48(3): 0320001. (in Chinese) doi:  10.3788/IRLA201948.0320001