宽场偏振干涉成像光谱仪的调制度研究

吴海英; 张三喜; 王维强; 张伟光; 张玉伦

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宽场偏振干涉成像光谱仪的调制度研究

吴海英, 张三喜, 王维强, 张伟光, 张玉伦

文章导航 > 红外与激光工程 > 2014 > 43(1): 201-207

吴海英, 张三喜, 王维强, 张伟光, 张玉伦. 宽场偏振干涉成像光谱仪的调制度研究[J]. 红外与激光工程, 2014, 43(1): 201-207.

引用本文:

吴海英, 张三喜, 王维强, 张伟光, 张玉伦. 宽场偏振干涉成像光谱仪的调制度研究[J]. 红外与激光工程, 2014, 43(1): 201-207.

Wu Haiying, Zhang Sanxi, Wang Weiqiang, Zhang Weiguang, Zhang Yulun. Interference visibility of wide-field-of-view polarization interference imaging spetrometer[J]. Infrared and Laser Engineering, 2014, 43(1): 201-207.

Citation:

Wu Haiying, Zhang Sanxi, Wang Weiqiang, Zhang Weiguang, Zhang Yulun. Interference visibility of wide-field-of-view polarization interference imaging spetrometer[J]. Infrared and Laser Engineering, 2014, 43(1): 201-207.

宽场偏振干涉成像光谱仪的调制度研究

1.
中国华阴兵器试验中心,陕西华阴714200;
2.
西安交通大学理学院,陕西西安710049

详细信息

作者简介:
吴海英（1983-），博士，主要从事成像、光谱、偏振技术方面的研究。Email：xiner1983@163.com

中图分类号: O436

Interference visibility of wide-field-of-view polarization interference imaging spetrometer

1.
Chinese Huayin Ordnance Test Center,Huayin 714200,China;
2.
School of Science,Xi'an Jiaotong University,Xi'an 710049,China

摘要: 干涉成像光谱技术是一种集双光束干涉技术、二维成像技术以及高分辨率光谱技术于一体的高新遥感探测技术，常用来进行监视、识别和探测各种民用和军事目标。基于双折射晶体的宽场偏振型干涉成像光谱仪是该技术中的一种典型代表，组成其系统的偏光元件的性能是决定其成像质量和光谱复原精度的关键因素。论文考虑元件偏振误差和延迟误差对光路传播的影响，采用偏振追迹法推导出了系统干涉调制度的理论表达式，给出了其随入射角、入射波长、入射方位角以及元件偏振化方向和相位延迟量的变化特性，并定量分析了其允差范围。这为基于偏光器件成像光谱仪的系统设计、高光谱复原以及工程实践提供了重要的理论指导和技术支持。
- 干涉调制度 /
- 偏振干涉成像光谱仪 /
- 偏振延迟误差 /
- 光谱复原
Abstract: Interference imaging spectroscopy (IIS) is a novel high technology integrated by the two-beam interference technique, 2D imaging technique and spectroscopy with high resolution. The wide-field-of- view polarized type is an attractive scheme in IIS. It employs polarized components to realize interference and thus the image quality and spectrum reconstruction are principally determined by the characteristics of these polarization components. In this work, theoretical analysis of the interference visibility was performed by considering the polarization deviations and the retardation deviation of elements. The theoretical expression of interference visibility was deduced by polarization tracing method. The varying characteristics of interference visibility with incident angle, wavelength, azimuth angle, polarization direction and phase retardation were presented and the permissible deviation was quantitatively analyzed. This work would provide suggestions for system design, hyperspectral reconstruction and engineering practice of spectrometers composed of polarization components.
- interference visibility /
- polarization interference imaging spectrometer /
- polatization and retardation deviation /
- spectrum reconstruction

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宽场偏振干涉成像光谱仪的调制度研究

1. 中国华阴兵器试验中心,陕西华阴714200;

2. 西安交通大学理学院,陕西西安710049

作者简介:
吴海英（1983-），博士，主要从事成像、光谱、偏振技术方面的研究。Email：xiner1983@163.com

收稿日期: 2013-05-07
修回日期: 2013-06-12
刊出日期: 2014-01-25

中图分类号: O436

关键词:

摘要: 干涉成像光谱技术是一种集双光束干涉技术、二维成像技术以及高分辨率光谱技术于一体的高新遥感探测技术，常用来进行监视、识别和探测各种民用和军事目标。基于双折射晶体的宽场偏振型干涉成像光谱仪是该技术中的一种典型代表，组成其系统的偏光元件的性能是决定其成像质量和光谱复原精度的关键因素。论文考虑元件偏振误差和延迟误差对光路传播的影响，采用偏振追迹法推导出了系统干涉调制度的理论表达式，给出了其随入射角、入射波长、入射方位角以及元件偏振化方向和相位延迟量的变化特性，并定量分析了其允差范围。这为基于偏光器件成像光谱仪的系统设计、高光谱复原以及工程实践提供了重要的理论指导和技术支持。

English Abstract

Interference visibility of wide-field-of-view polarization interference imaging spetrometer

1. Chinese Huayin Ordnance Test Center,Huayin 714200,China;

2. School of Science,Xi'an Jiaotong University,Xi'an 710049,China

Received Date: 2013-05-07
Rev Recd Date: 2013-06-12
Publish Date: 2014-01-25

Keywords:

interference visibility /
polarization interference imaging spectrometer /
polatization and retardation deviation /
spectrum reconstruction

Abstract: Interference imaging spectroscopy (IIS) is a novel high technology integrated by the two-beam interference technique, 2D imaging technique and spectroscopy with high resolution. The wide-field-of- view polarized type is an attractive scheme in IIS. It employs polarized components to realize interference and thus the image quality and spectrum reconstruction are principally determined by the characteristics of these polarization components. In this work, theoretical analysis of the interference visibility was performed by considering the polarization deviations and the retardation deviation of elements. The theoretical expression of interference visibility was deduced by polarization tracing method. The varying characteristics of interference visibility with incident angle, wavelength, azimuth angle, polarization direction and phase retardation were presented and the permissible deviation was quantitatively analyzed. This work would provide suggestions for system design, hyperspectral reconstruction and engineering practice of spectrometers composed of polarization components.