用响应和串音识别焦平面探测器相连缺陷元研究

侯治锦; 傅莉; 王巍; 吕衍秋; 鲁正雄; 王锦春

doi:10.3788/IRLA201746.0420002

用响应和串音识别焦平面探测器相连缺陷元研究

doi: 10.3788/IRLA201746.0420002

侯治锦^1,2,3,
傅莉¹,
王巍^2,3,
吕衍秋^2,3,
鲁正雄^2,3,
王锦春^2,3

1.
西北工业大学电子信息学院,陕西西安 710072;
2.
中国空空导弹研究院,河南洛阳 471099;
3.
红外探测器技术航空科技重点实验室,河南洛阳 471099

基金项目:

航空创新基金（2011D01406）

详细信息

作者简介:
侯治锦(1982-),男,博士,从事红外焦平面探测器方面的研究。Email:changhui090504@126.com

中图分类号: TN215

Study on connected defective elements in focal plane array identification by response and crosstalk

Hou Zhijin^1,2,3,
Fu Li¹,
Wang Wei^2,3,
Lv Yanqiu^2,3,
Lu Zhengxiong^2,3,
Wang Jinchun^2,3

1.
School of Electronics and Information,Northwestern Polytechnical University,Xi'an 710072,China;
2.
China Airborne Missle Academy,Luoyang 471099,China;
3.
Aviation Key Laboratory of Science and Technology on Infrared detector,Luoyang 471099,China

摘要: 采用高倍光学显微镜和焦平面探测器测试系统对焦平面探测器相连缺陷元进行了测试分析，研究了焦平面探测器相连缺陷元的成因。研究结果表明：借助高倍光学显微镜很难识别相连缺陷元；采用焦平面探测器响应测试系统进行测试时，相连缺陷元的响应电压与正常元基本相同，相连缺陷元无法被识别；采用焦平面探测器串音测试系统进行测试时，相连缺陷元之间串音为100%，明显不同于正常元，此时两元相连缺陷元响应电压是正常元响应电压的二分之一，相连缺陷元可以被有效识别。光刻腐蚀引入的台面或电极相连，以及光刻剥离引入的铟柱相连导致了缺陷元的产生；通过光刻腐蚀、剥离工艺优化，可以有效减少焦平面探测器相连缺陷元。
- 焦平面探测器 /
- 相连缺陷元 /
- 识别 /
- 响应 /
- 串音
Abstract: The connected defective elements in Focal Plane Array (FPA) were tested by optical microscopy and FPA test-bench. The reasons of forming connected defective elements in FPA were studied. Results show that it is difficult to identify connected defective elements by optical microscopy. And it is also difficult to identify connected defective elements by FPA response testing bench because the response voltage of connected defective elements is basically the same as that of normal elements. The connected defective elements can be identified effectively by FPA crosstalk testing bench because the crosstalk between connected defective elements is 100%, which is obviously different from that of the normal elements. At this point, the response voltage of connected defective elements is average of that of the normal elements. The tables with connecting or the electrodes with connecting caused by the process of photolithography and eroding result in the generation of the connected defective elements. As well as the indium bump with connecting caused by the process of photolithography and lift-off also leads to the generation of the connected defective elements. Fabrication process such as photolithography, eroding and lift-off was optimized to reduce connected defective elements.
- FPA /
- connected defective elements /
- identify /
- response /
- crosstalk

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用响应和串音识别焦平面探测器相连缺陷元研究

doi: 10.3788/IRLA201746.0420002

作者简介:
侯治锦(1982-),男,博士,从事红外焦平面探测器方面的研究。Email:changhui090504@126.com

Study on connected defective elements in focal plane array identification by response and crosstalk

计量

用响应和串音识别焦平面探测器相连缺陷元研究

doi: 10.3788/IRLA201746.0420002

1. 西北工业大学电子信息学院,陕西西安 710072;

2. 中国空空导弹研究院,河南洛阳 471099;

3. 红外探测器技术航空科技重点实验室,河南洛阳 471099

作者简介:
侯治锦(1982-),男,博士,从事红外焦平面探测器方面的研究。Email:changhui090504@126.com

English Abstract

Study on connected defective elements in focal plane array identification by response and crosstalk

1. School of Electronics and Information,Northwestern Polytechnical University,Xi'an 710072,China;

2. China Airborne Missle Academy,Luoyang 471099,China;

3. Aviation Key Laboratory of Science and Technology on Infrared detector,Luoyang 471099,China

全文HTML

目录

留言板

用响应和串音识别焦平面探测器相连缺陷元研究

doi: 10.3788/IRLA201746.0420002

作者简介: 侯治锦(1982-),男,博士,从事红外焦平面探测器方面的研究。Email:changhui090504@126.com

Study on connected defective elements in focal plane array identification by response and crosstalk

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出版历程

用响应和串音识别焦平面探测器相连缺陷元研究

doi: 10.3788/IRLA201746.0420002

1. 西北工业大学 电子信息学院,陕西 西安 710072; 2. 中国空空导弹研究院,河南 洛阳 471099; 3. 红外探测器技术航空科技重点实验室,河南 洛阳 471099

作者简介: 侯治锦(1982-),男,博士,从事红外焦平面探测器方面的研究。Email:changhui090504@126.com

English Abstract

Study on connected defective elements in focal plane array identification by response and crosstalk

1. School of Electronics and Information,Northwestern Polytechnical University,Xi'an 710072,China; 2. China Airborne Missle Academy,Luoyang 471099,China; 3. Aviation Key Laboratory of Science and Technology on Infrared detector,Luoyang 471099,China

全文HTML

目录

作者简介:
侯治锦(1982-),男,博士,从事红外焦平面探测器方面的研究。Email:changhui090504@126.com

1. 西北工业大学电子信息学院,陕西西安 710072;

2. 中国空空导弹研究院,河南洛阳 471099;

3. 红外探测器技术航空科技重点实验室,河南洛阳 471099

作者简介:
侯治锦(1982-),男,博士,从事红外焦平面探测器方面的研究。Email:changhui090504@126.com

1. School of Electronics and Information,Northwestern Polytechnical University,Xi'an 710072,China;

2. China Airborne Missle Academy,Luoyang 471099,China;

3. Aviation Key Laboratory of Science and Technology on Infrared detector,Luoyang 471099,China