姚萍萍, 涂碧海, 邹征宇, 许智龙, 张爱文, 孙亮, 骆冬根, 洪津. 星载偏振相机模拟前端单粒子锁定及损伤机理[J]. 红外与激光工程, 2022, 51(3): 20210226. DOI: 10.3788/IRLA20210226
引用本文: 姚萍萍, 涂碧海, 邹征宇, 许智龙, 张爱文, 孙亮, 骆冬根, 洪津. 星载偏振相机模拟前端单粒子锁定及损伤机理[J]. 红外与激光工程, 2022, 51(3): 20210226. DOI: 10.3788/IRLA20210226
Yao Pingping, Tu Bihai, Zou Zhengyu, Xu Zhilong, Zhang Aiwen, Sun Liang, Luo Donggen, Hong Jin. Single event latch-up and damage mechanism of analog front-end for satellite-borne polarization camera[J]. Infrared and Laser Engineering, 2022, 51(3): 20210226. DOI: 10.3788/IRLA20210226
Citation: Yao Pingping, Tu Bihai, Zou Zhengyu, Xu Zhilong, Zhang Aiwen, Sun Liang, Luo Donggen, Hong Jin. Single event latch-up and damage mechanism of analog front-end for satellite-borne polarization camera[J]. Infrared and Laser Engineering, 2022, 51(3): 20210226. DOI: 10.3788/IRLA20210226

星载偏振相机模拟前端单粒子锁定及损伤机理

Single event latch-up and damage mechanism of analog front-end for satellite-borne polarization camera

  • 摘要: 单粒子锁定效应容易引起星载遥感仪器产生故障。针对空间高能粒子辐射环境诱发的偏振遥感相机性能退化问题,利用高能重离子和皮秒脉冲激光对星载偏振成像仪选用的模拟前端信号处理器开展了试验研究,获得了此类器件的单粒子锁定特点,为工程设计及试验评估提供了参考。试验结果显示:偏振成像仪选用的模拟前端信号处理器对重离子诱发的单粒子锁定比较敏感,单粒子锁定LET阈值处于4.4~13.4 MeV·cm2·mg−1之间。针对模拟前端芯片LET阈值偏低的问题,提出了一种模拟供电端和数字供电端串联大功率防闩锁限流电阻和在轨定时开关机的设计方法。试验结果表明,该方法可有效避免器件单粒子锁定造成的器件过流烧毁及仪器失效等故障。研究结果可为星载偏振相机用模拟前端信号处理器抗辐射加固设计和单粒子地面模拟实验方法的建立提供技术基础与保障。

     

    Abstract: Single event latch-up (SEL) effect is one of the major factors that induce the failure of space-borne remote sensing instrument. To clarify the mechanism associated with the deterioration of polarization remote sensing camera induced by space high-energy particle radiation environments, the experiments were performed on the analog front-end signal processor of the directional polarization camera with heavy-ion and pulsed laser, for the purpose of identifying the single event effects sensitivity and providing technical guarantee for engineering design and test evaluation. The experimental results indicate that the analog front-end signal processor is susceptible to the SEL effect induced by heavy-ion, the linear energy transfer (LET) threshold is around 4.4-13.4 MeV·cm2·mg−1. Aiming at the low LET threshold, a design method of high power anti-latch up current limiting resistors in series to the analog and digital power supply terminal and the timing power on and off scheme was proposed. The results reveal that this method can effectively avoid the over-current burnout of the device and instrument failure caused by SEL. These research results provide significant reference data for the radiation-proofing design of analog front-end signal processor for the satellite-borne polarization camera and the experimental methods for single-event simulation on the ground.

     

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