Scanning near-field circular polarization optical microscope

Jin Tao; Xie Mengyu; Ji Hudong; Wu Dandan; Zheng Jihong

doi:10.3788/IRLA201746.1103003

A scanning near-field optical microscope (SNOM) based on an apertureless optical probe was presented. The probe had a V shape hollow on its top and coated with metal film. Illumination near-field light (NFL) will emit from the apex of probe when far-field light (FFL) is focused on the hollow. There is a phase difference between collected NFL and FFL, which relates to the distance between probe and sample. The collected FFL can be eliminated using a Glan-Taylor analyzer according to the phase difference. The experimental results show the phase difference of this system is 57. The spatial resolution of SNCOM is less than 12 nm.

Scanning near-field circular polarization optical microscope

1. Shanghai Key Lab of Modern Optical System,School of Optical-Electrical and Computer Engineering,University of Shanghai for Science and Technology,Shanghai 200093,China

Received Date: 2017-10-05

Rev Recd Date: 2017-11-03

Publish Date: 2017-11-25

Key words:

near-field opitcs /
apertureless optical probe /
scanning near-field circular polarization optical microscope

Abstract: A scanning near-field optical microscope (SNOM) based on an apertureless optical probe was presented. The probe had a V shape hollow on its top and coated with metal film. Illumination near-field light (NFL) will emit from the apex of probe when far-field light (FFL) is focused on the hollow. There is a phase difference between collected NFL and FFL, which relates to the distance between probe and sample. The collected FFL can be eliminated using a Glan-Taylor analyzer according to the phase difference. The experimental results show the phase difference of this system is 57. The spatial resolution of SNCOM is less than 12 nm.

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Reference (11)

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Scanning near-field circular polarization optical microscope

doi: 10.3788/IRLA201746.1103003

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