Volume 47 Issue 4
Apr.  2018
Turn off MathJax
Article Contents

Shi Yali, Tao Xian, Zhou Xinda, Zhang Jiabin, Ding Lei, Zhang Zhengtao. An online laser-induced flaw inspection device for optical elements[J]. Infrared and Laser Engineering, 2018, 47(4): 417003-0417003(7). doi: 10.3788/IRLA201847.0417003
Citation: Shi Yali, Tao Xian, Zhou Xinda, Zhang Jiabin, Ding Lei, Zhang Zhengtao. An online laser-induced flaw inspection device for optical elements[J]. Infrared and Laser Engineering, 2018, 47(4): 417003-0417003(7). doi: 10.3788/IRLA201847.0417003

An online laser-induced flaw inspection device for optical elements

doi: 10.3788/IRLA201847.0417003
  • Received Date: 2017-11-10
  • Rev Recd Date: 2017-12-28
  • Publish Date: 2018-04-25
  • The laser-induced damage experiments are very important to verify the reliability and lifespan of the optical elements. The optical elements are irradiated by the high energy laser frequently and the corresponding damage information is recorded by the researchers. A device was designed and constructed to inspect the surface flaws of the optical elements on line efficiently and automatically. The device was composed of six parts, which were automatic zoom microscopic camera, spectral confocal sensor, two dimensional scan movement axes, focus movement axis, fast reset platform and system controller. The laser irradiated area of the optical elements was scanned by the two dimensional scan movement axes according to the planned path. The work distance of the microscope was detected by the spectral confocal sensor and adjusted by the movement of the focus axis. The sub images were acquired by the microscopic camera and saved to the computer. Firstly, the main error factors that affect the image matching precision were analyzed and compensated by the image correction and so on. Then the image with large area and high resolution was obtained by stitching the corrected sub images. Lastly, the damage information was obtained after image processing. The experimental results show that the time is no more than 5 minutes to detect an area of 15 mm15 mm. The resolution of the microscope imaging system is better than 228 lp/mm and the stitching error is better than 2 pixel.
  • [1] Liu Anping, Duan Lihua, Hu Jianping, et al. Automatic detection of laser damage threshold by scattering light technique[C]//Proceedings of the 6th World Congress on Intelligent Control and Automation, 2006:5318-5321.
    [2] Zhou Gang, Ma Bin, Jiao Hongfei, et al. 1064 nm high-reflection mirrors[J]. High Power Laser and Particle Beams, 2011, 23(4):963-968. (in Chinese)周刚, 马彬, 焦宏飞, 等. 1064 nm高反射薄膜激光损伤阈值测量方法[J]. 强激光与粒子束, 2011, 23(4):963-968.
    [3] Alan Conder, Terry Alger, Stephen Azevedo, et al. Final optics damage inspection (FODI) for the national ignition facility[J]. Laser-Induced Damage in Optical Materials, 2007, 6720:1-15.
    [4] Xu Longbo, Peng Zhitao, Sun Zhihong, et al. Damage online inspection technology of driver terminal optical elements[J]. Infrared and Laser Engineering, 2009, 38(4):721-724. (in Chinese)徐隆波, 彭志涛, 孙志红, 等. 驱动器终端光学组件损伤在线检测技术[J]. 红外与激光工程, 2009, 38(4):721-724.
    [5] Feng Bo, Liu Bingguo, Chen Fengdong, et al. Final optics damage online inspection system for ICF[J]. Infrared and Laser Engineering, 2013, 42(9):2519-2524. (in Chinese)冯博, 刘炳国, 陈凤东, 等. ICF终端光学元件损伤在线检测装置的研究[J]. 红外与激光工程, 2013, 42(9):2519-2524.
    [6] Tao Xian, Zhang Zhengtao, Zhang Feng, et al. Development of detection techniques of surface defects for large aperture optical elements based on machine vision[C]//Proceedings of the 33rd Chinese Control Conference, 2014:2935-2940.
    [7] Benjamin Potsaid, Yves Bellouard, John T. Design of an adaptive scanning optical microscope for simultaneous large field of view and high resolution[C]//Proceedings of the 2005 IEEE International Conference on Robotics and Automation, 2005:460-465.
    [8] Yang Yongying, Lu Chunhua, Liang Jiao, et al. Microscopic dark-field scattering imaging and digitalization evaluation system of defects on optical devices precision surface[J]. Acta Optica Sinica, 2013, 42(9):1031-1038. (in Chinese)杨甬英, 陆春华, 梁蛟, 等. 光学元件表面缺陷的显微散射暗场成像及数字化评价系统[J].光学学报, 2013, 42(9):1031-1038.
    [9] Cheng Xiaofeng, Xu Xu, Zhang Lin, et al. Defect testing of large aperture optics based on high resolution CCD camera[J]. High Power Laser and Particle Beams, 2009, 21(11):1677-1680. (in Chinese)程晓锋, 徐旭, 张林, 等. 基于高分辨力CCD的大口径光学元件疵病检测[J]. 强激光与粒子束, 2009, 21(11):1677-1680.
    [10] Xian Tao, Zhengtao Zhang, Feng Zhang, et al. A novel and effective surface flaw inspection instrument for large-aperture optical elements[J]. IEEE Transactions on Instrumentation and Measurement, 2015, 64(9):2530-2540.
    [11] Xiao Bing, Yang Yongying, Gao Xin, et al. Mosaic algorithm for images of detects on surface of large fine optics[J]. Journal of Zhejiang University (Engineering Science), 2011, 45(2):375-381. (in Chinese)肖冰, 杨甬英, 高鑫, 等. 适于大口径精密光学表面疵病图像的拼接算法[J].浙江大学学报(工学版), 2011, 45(2):375-381.
  • 加载中
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Article Metrics

Article views(323) PDF downloads(87) Cited by()

Related
Proportional views

An online laser-induced flaw inspection device for optical elements

doi: 10.3788/IRLA201847.0417003
  • 1. Research Center of Precision Sensing and Control,Institute of Automation,Chinese Academy of Sciences,Beijing 100190,China;
  • 2. Research Center of Laser Fusion,China Academy of Engineering Physics,Mianyang 621900,China

Abstract: The laser-induced damage experiments are very important to verify the reliability and lifespan of the optical elements. The optical elements are irradiated by the high energy laser frequently and the corresponding damage information is recorded by the researchers. A device was designed and constructed to inspect the surface flaws of the optical elements on line efficiently and automatically. The device was composed of six parts, which were automatic zoom microscopic camera, spectral confocal sensor, two dimensional scan movement axes, focus movement axis, fast reset platform and system controller. The laser irradiated area of the optical elements was scanned by the two dimensional scan movement axes according to the planned path. The work distance of the microscope was detected by the spectral confocal sensor and adjusted by the movement of the focus axis. The sub images were acquired by the microscopic camera and saved to the computer. Firstly, the main error factors that affect the image matching precision were analyzed and compensated by the image correction and so on. Then the image with large area and high resolution was obtained by stitching the corrected sub images. Lastly, the damage information was obtained after image processing. The experimental results show that the time is no more than 5 minutes to detect an area of 15 mm15 mm. The resolution of the microscope imaging system is better than 228 lp/mm and the stitching error is better than 2 pixel.

Reference (11)

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return