A simple and accurate wavelength calibration method for CCD-spectrometer

Ma Yan; Xia Guo; Huang Chan; Wang Guodong; Jin Shiqun

doi:10.3788/IRLA201847.S117002

Wavelength calibration is an important step for CCD-spectrometers. The accuracy of the wavelength calibration will affect the precision of the measurement results. However, the accuracy of traditional wavelength calibration will be affected by instrument bandwidth and noise. The bandwidth of the instrument will generate the overlapping peaks in the calibration spectrum or cause the peak position shift of double peak. The noise will make inaccurate measurement of peak point. To solve this problem, a simple and accurate wavelength calibration method for CCD-spectrometer was proposed. The automated decomposition algorithm and Voigt line profile model were used to optimize the shape of the calibration spectrum and the precision value of the peak points of each calibration peak could be obtained. Using this method, the influence of bandwidth and noise could be eliminated, especially the overlap peaks could be decomposed into several single peaks, simultaneously, and the process of calibration was greatly simplified. Experiments based on USB4000 spectrometer with mercury-argon calibration light source were implemented. The results show that the proposed method could achieve higher accuracy and the calibration deviation is less than 0.1 nm. Therefore, it is recommended to use this method to calibrate the wavelength of the spectrometer.

A simple and accurate wavelength calibration method for CCD-spectrometer

1. Academy of Photoelectric Technology,Hefei University of Technology,Hefei 230009,China;

2. National Engineering Laboratory of Special Display Technology,Hefei 230009,China;

3. National Key Laboratory of Advanced Display Technology,Hefei 230009,China

Received Date: 2018-02-20

Rev Recd Date: 2018-04-15

Publish Date: 2018-06-25

Key words:

Abstract: Wavelength calibration is an important step for CCD-spectrometers. The accuracy of the wavelength calibration will affect the precision of the measurement results. However, the accuracy of traditional wavelength calibration will be affected by instrument bandwidth and noise. The bandwidth of the instrument will generate the overlapping peaks in the calibration spectrum or cause the peak position shift of double peak. The noise will make inaccurate measurement of peak point. To solve this problem, a simple and accurate wavelength calibration method for CCD-spectrometer was proposed. The automated decomposition algorithm and Voigt line profile model were used to optimize the shape of the calibration spectrum and the precision value of the peak points of each calibration peak could be obtained. Using this method, the influence of bandwidth and noise could be eliminated, especially the overlap peaks could be decomposed into several single peaks, simultaneously, and the process of calibration was greatly simplified. Experiments based on USB4000 spectrometer with mercury-argon calibration light source were implemented. The results show that the proposed method could achieve higher accuracy and the calibration deviation is less than 0.1 nm. Therefore, it is recommended to use this method to calibrate the wavelength of the spectrometer.

HTML

Reference (12)

[1]	Zonios G. Noise and stray light characterization of a compact CCD spectrophotometer used in biomedical applications[J]. Applied Optics, 2010, 49(2):163-169.
[2]	Eichstdt S, Schmhling F, Wbbeler G, et al. Comparison of the Richardson-Lucy method and a classical approach for spectrometer bandpass correction[J]. Metrologia, 2013, 50(2):107-118.
[3]	Sansonetti C J, Salit M L, Reader J. Wavelengths of spectral lines in mercury pencil lamps[J]. Applied Optics, 1996, 35(1):78-83.
[4]	Martinsen P, Jordan B, Mcglone A, et al. Accurate and precise wavelength calibration for wide bandwidth array spectrometers[J]. Applied Spectroscopy, 2008, 62(9):1008-1012.
[5]	Yu F. Accurate wavelength calibration method using system parameters for grating spectrometers[J]. Optical Engineering, 2013, 52(1):3603.
[6]	Li X, Zhang G W, Xun L N, et al. Wavelength calibration of shortwave infrared flat spectroradiometer[J]. Acta Optica Sinica, 2008, 28(5):902-906.
[7]	Sun Y C, Huang C, Xia G, et al. Accurate wavelength calibration method for compact CCD spectrometer[J]. Journal of the Optical Society of America-A Optics Image Science Vision, 2017, 34(4):498.
[8]	Levenberg K. A method for the solution of certain non-linear problems in least squares[J]. Quarterly of Applied Mathematics, 1944, 2(4):436-438.
[9]	Marquardt D W. An algorithm for least-squares estimation of nonlinear parameters[J]. Journal of the Society for Industrial Applied Mathematics, 1964, 11(2):431-441.
[10]	Nocedal J, Wright S J. Numerical Optimization[M]. Berlin:Springer, 1999.
[11]	Sundius T. Computer fitting of voigt profiles to Raman lines[J]. Journal of Raman Spectroscopy, 1973, 1(5):471-488.
[12]	Yuan J, Sun J, Hu Z. High-order cumulant-based blind deconvolution of Raman spectra[J]. Applied Optics, 2005, 44:7595-7601.

A simple and accurate wavelength calibration method for CCD-spectrometer

doi: 10.3788/IRLA201847.S117002

Abstract

References

Proportional views

通讯作者: 陈斌, bchen63@163.com

Article Metrics

Related

Proportional views