Volume 48 Issue 8
Aug.  2019
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Mao Shanshan, Li Yanqiu, Liu Ke, Liu Lihui, Zheng Meng, Yan Xu. Optical design of high numerical aperture extreme ultraviolet lithography objective with freeform surfaces[J]. Infrared and Laser Engineering, 2019, 48(8): 814002-0814002(7). doi: 10.3788/IRLA201948.0814002
Citation: Mao Shanshan, Li Yanqiu, Liu Ke, Liu Lihui, Zheng Meng, Yan Xu. Optical design of high numerical aperture extreme ultraviolet lithography objective with freeform surfaces[J]. Infrared and Laser Engineering, 2019, 48(8): 814002-0814002(7). doi: 10.3788/IRLA201948.0814002

Optical design of high numerical aperture extreme ultraviolet lithography objective with freeform surfaces

doi: 10.3788/IRLA201948.0814002
  • Received Date: 2019-03-05
  • Rev Recd Date: 2019-04-03
  • Publish Date: 2019-08-25
  • High numerical aperture(NA) projection objectives with freeform surfaces are demanded for extreme ultraviolet lithography(EUVL) with high resolution. The traditional aspherical EUVL lens design is difficult to meet the need of correcting aberrations under a large NA, which often causes obscuration and destroys the imaging contrast. A design method of a high NA EUVL objective with freeform surfaces and without obscurations was proposed. Lens-form parameters were used to determine the best position to insert freeform surface, which could effectively correct aberrations and increase NA of the system without affecting the imaging performance. A set of high NA EUVL projection objective(PO) with freeform surfaces was designed by this method. Compared with the initial aspherical objective, by adding four freeform surfaces, the objective NA was increased from 0.3 to 0.35 and wavefront error RMS was reduced from 1 nm to 0.6 nm, and there was no obscuration in the entire optical path. The design results indicate that the proposed method effectively improves the design efficiency of the freeform surfaces EUVL objective. In the case of no obscuration, the system not only increases the NA, but also reduces the wavefront error, which greatly improves the overall performance of the objective.
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Optical design of high numerical aperture extreme ultraviolet lithography objective with freeform surfaces

doi: 10.3788/IRLA201948.0814002
  • 1. Key Laboratory of Photoelectronic Imaging Technology and System,Ministry of Education,School of Optics and Photonics,Beijing Institute of Technology,Beijing 100081,China

Abstract: High numerical aperture(NA) projection objectives with freeform surfaces are demanded for extreme ultraviolet lithography(EUVL) with high resolution. The traditional aspherical EUVL lens design is difficult to meet the need of correcting aberrations under a large NA, which often causes obscuration and destroys the imaging contrast. A design method of a high NA EUVL objective with freeform surfaces and without obscurations was proposed. Lens-form parameters were used to determine the best position to insert freeform surface, which could effectively correct aberrations and increase NA of the system without affecting the imaging performance. A set of high NA EUVL projection objective(PO) with freeform surfaces was designed by this method. Compared with the initial aspherical objective, by adding four freeform surfaces, the objective NA was increased from 0.3 to 0.35 and wavefront error RMS was reduced from 1 nm to 0.6 nm, and there was no obscuration in the entire optical path. The design results indicate that the proposed method effectively improves the design efficiency of the freeform surfaces EUVL objective. In the case of no obscuration, the system not only increases the NA, but also reduces the wavefront error, which greatly improves the overall performance of the objective.

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