Jiang Yankun, Piao Heng, Wang Peng, Li Hengkuan, Li Zheng, Wang Biao, Bai Huifeng, Chen Chen. Research on high precision temperature control system using linear auto disturbance rejection technique[J]. Infrared and Laser Engineering, 2023, 52(2): 20210813. doi: 10.3788/IRLA20210813
Citation:
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Jiang Yankun, Piao Heng, Wang Peng, Li Hengkuan, Li Zheng, Wang Biao, Bai Huifeng, Chen Chen. Research on high precision temperature control system using linear auto disturbance rejection technique[J]. Infrared and Laser Engineering, 2023, 52(2): 20210813. doi: 10.3788/IRLA20210813
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Research on high precision temperature control system using linear auto disturbance rejection technique
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Jiang Yankun1
,
,
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Piao Heng1
,
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Wang Peng1
,
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Li Hengkuan1
,
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Li Zheng1
,
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Wang Biao2
,
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Bai Huifeng3
,
-
Chen Chen1
,
,
- 1.
College of Instrumentation and Electrical Engineering, Jilin University, Changchun 130026, China
- 2.
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
- 3.
Beijing Smart-Chip Microelectronics Technology Company Limited, Beijing 102200, China
- Received Date: 2021-11-02
- Rev Recd Date:
2021-11-22
- Accepted Date:
2021-11-23
- Publish Date:
2023-02-25
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Abstract
With the development of photoelectric measurement technology, infrared gas detection technology is widely used in many fields. Temperature has an important influence on the detection of gas concentration and isotopic abundance. The traditional temperature control system using proportional integral differential (PID) control algorithm has the disadvantages of overshoot, slow response time and low precision. Firstly, COMSOL software is used to determine the heating structure by finite element analysis. Secondly, the STM32 single chip microcomputer is used to collect real-time temperature data through 16 bit AD chip LTC1864. Finally, the linear auto disturbance rejection algorithm (LADRC) is used to adjust the PWM wave that achieve the high-precision and real-time dynamic adjustment of the system temperature by controlling the semiconductor cooler (TEC). Under the temperature of 19.8 ℃ condition, an temperature control experiments with a target temperature of 32 ℃ is carried out. The results show that the standard deviation of temperature fluctuation is 0.0357 ℃. Compared with the temperature control system using PID algorithm, it has the advantages of no overshoot, fast response time and high precision.
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