Volume 43 Issue 6
Aug.  2014
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Li Jianglan, Shi Yunbo, Zhao Pengfei, Gao Wenhong, Chen Haiyang, Du Binbin. High precision thermostat system with TEC for laser diode[J]. Infrared and Laser Engineering, 2014, 43(6): 1745-1749.
Citation: Li Jianglan, Shi Yunbo, Zhao Pengfei, Gao Wenhong, Chen Haiyang, Du Binbin. High precision thermostat system with TEC for laser diode[J]. Infrared and Laser Engineering, 2014, 43(6): 1745-1749.

High precision thermostat system with TEC for laser diode

  • Received Date: 2013-10-10
  • Rev Recd Date: 2013-11-25
  • Publish Date: 2014-06-25
  • Thermoelectric cooler (TEC) had an extensive prospect for the application of refrigeration system for laser diode (LD) for its advantage such as small in size, easy to control and so on. But it was necessary to ensure the match between the cooling power of TEC and the thermal power of the target;otherwise it would lead inadequate cooling or excessive power dissipation. In this paper, a high precision thermostat system with TEC for laser diode was designed. In this system, the cooling power of TEC was determined by the thermal load of LD, proportional-integral-derivative (PID) control method was used to optimize the parameters of the thermostat system. An experiment was executed to verify the design. The experimental results showed that the work temperature of LD could be controlled between 5℃ and 41℃ with a control accuracy of 0.05℃ and the steady state error was small. The system could be a good solution for the high-precision wavelength testing.
  • [1] Dai Qin, Song Wenwu, Wang Xijun. Design and stability analysis of high frequency LD's driving circuit[J]. Optics and Precision Engineering, 2006, 14 (5): 475-478. (in Chinese) 岱钦, 宋文武, 王希军. 高频半导体激光器的驱动设计及稳定性分析[J]. 光学精密工程, 2006, 14(5): 475-478.
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    [3] Huang Yuewei, Cui Ruizhen, Gonh Mali, et al. TEC based thermostat system for high-power semiconductor laser[J]. Infrared and Laser Engineering, 2006, 35(2): 143-147.(in Chinese) 黄岳巍, 崔瑞祯, 巩马理, 等. 基于TEC 的大功率LD 恒温控制系统的研究[J]. 红外与激光工程, 2006, 35(2): 143-147.
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    [6] Tang Wenyan, Sun Xiaoming, Zhou Yanzhou, et al. Design of the system for accurately controlling temperature of the laser diode[J]. Journal of Harbin Institute of Technology, 1994, 26(4): 10-12. (in Chinese) 唐文彦, 孙晓明, 周延周, 等. 半导体激光器高精度温度控制系统的设计[J]. 哈尔滨工业大学学报, 1994, 26(4): 10-12.
    [7] Zhang Hongrui, Gao Mingyi, Zheng Yi. 1.34 m Nd:YVO laser end-pumped by a diode-laser[J]. Chinese Journal of Laser, 2004, 31(1): 19-21. (in Chinese) 张红瑞, 高明义, 郑义. 大功率激光二极管端面抽运的Nd:YVO4激光器[J]. 中国激光, 2004, 31(1): 19-21.
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    [9] Chen Guoxiang, Zhang Haimei, Wang Jinjiang, et al. MCUbased temperature control system for laser diode[J]. Process Automation Instrumentation, 2007, 28(2): 53-57.(in Chinese) 陈国相, 张海明, 王晋疆, 等. 基于单片机的激光二极管温控系统[J]. 自动化仪表, 2007, 28(2): 53-57.
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    [13] Zhang Hongwu, Zhang Liang, Li Kun, et al. Temperature control system of high power semiconductor laser[J]. Journal of University, 2005, 43(5): 642-644. (in Chinese) 张洪武, 张亮, 李坤, 等. 大功率半导体激光器恒温系统[J]. 吉林大学学报, 2005, 43(5): 642-644.
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High precision thermostat system with TEC for laser diode

  • 1. Key Laboratory of Instrumentation Science & Dynamic Measurement,Ministry of Education,North University of China,Taiyuan 030051,China

Abstract: Thermoelectric cooler (TEC) had an extensive prospect for the application of refrigeration system for laser diode (LD) for its advantage such as small in size, easy to control and so on. But it was necessary to ensure the match between the cooling power of TEC and the thermal power of the target;otherwise it would lead inadequate cooling or excessive power dissipation. In this paper, a high precision thermostat system with TEC for laser diode was designed. In this system, the cooling power of TEC was determined by the thermal load of LD, proportional-integral-derivative (PID) control method was used to optimize the parameters of the thermostat system. An experiment was executed to verify the design. The experimental results showed that the work temperature of LD could be controlled between 5℃ and 41℃ with a control accuracy of 0.05℃ and the steady state error was small. The system could be a good solution for the high-precision wavelength testing.

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