Volume 43 Issue 6
Aug.  2014
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Yang Liang, Li Yanqiu, Ma Xu, Sheng Naiyuan. Rigorous coupled wave analysis of grating-embedded multilayer structure conical diffraction[J]. Infrared and Laser Engineering, 2014, 43(6): 1899-1904.
Citation: Yang Liang, Li Yanqiu, Ma Xu, Sheng Naiyuan. Rigorous coupled wave analysis of grating-embedded multilayer structure conical diffraction[J]. Infrared and Laser Engineering, 2014, 43(6): 1899-1904.

Rigorous coupled wave analysis of grating-embedded multilayer structure conical diffraction

  • Received Date: 2013-10-14
  • Rev Recd Date: 2013-11-15
  • Publish Date: 2014-06-25
  • Based on rigorous coupled wave analysis, the models for grating-embedded multilayer structure planar diffraction were generalized to the case of conical diffraction. The proposed method can be used to calculate the light diffracted from the grating-embedded multilayer structure with arbitrary wavelength, polarization, azimuthal angle and incident angle. For the micromachined optoacoustic sensor, the convergence performance of the diffraction efficiencies of the reflected +1st order in conical diffraction was investigated. The simulations show that using a 4m grating period and TM (Transverse Magnetic) polarization, when the numbers of harmonics M(2n+1) are 67, 69 and 71, the diffraction efficiencies of the +1st order are 28.86%, 28.84% and 28.86%, respectively. Then the displacement sensitivity of the micromachined optoacoustic sensor was optimized. When the incident angle, the azimuthal angle and the grating period are 22, 10and 1 m, respectively, compared with the +1st diffracted orders of 4 m grating period, the displacement sensitivity of the 0th and +1st orders under TE and TM polarization was nearly doubled. It can be used to accurately monitor the metal membrane displacement induced by the acoustic pressure or electrostatic actuation voltage.
  • [1] Wang Bo. Polarization-sele ctivity of high-density phase gratings[J]. Chinese Journal of Optics and Applied Optics, 2010, 3(4): 348-352. (in Chinese) 王博.高密度相位光栅的偏振选择性[J]. 中国光学与应用光学, 2010, 3(4): 348-352.
    [2]
    [3] Cai Tuo, Sang Tian, Zhao Hua. Coupled-wave analysis, numerical calculation and discussion for diffraction properties of grating[J]. Opto-Electronic Engineering, 2010, 37(4): 141-146. (in Chinese) 蔡托, 桑田, 赵华. 光栅衍射特性的耦合波分析尧计算与讨论[J]. 光电工程, 2010, 37(4): 141-146.
    [4]
    [5] Fan Shuwei, Zhou Qinghua, Li Hong. Research of optimization design of groove diffraction grating profile parameters[J]. Acta Optica Sinica, 2010, 30 (11): 3133-3139. (in Chinese) 樊叔维, 周庆华, 李红. 槽型衍射光栅结构参数优化设计研究[J]. 光学学报, 2010, 30(11): 3133-3139.
    [6]
    [7]
    [8] Wang Haibin, Wu Jianhong, Liu Quan. Diffraction characteristics of convex rectangular grating[J]. Laser Journal, 2010, 31(4): 15-17. (in Chinese) 汪海宾, 吴建宏, 刘全. 凸球面矩型槽光栅的衍射特性. 激光杂志, 2010, 31(4): 15-17.
    [9] Yang Huiyin, Zhang Dawei, Huang Yuansheng, et al. Analysis of the electromagnetic field in the subwavelength grating using methods of coupling-wave and pattern-matching respectively[J]. Laser Journal, 2011, 32(1): 29-31. (in Chinese) 杨惠尹, 张大伟, 黄元申, 等. 耦合波法和模式匹配法分析亚波长光栅中的光场分布[J]. 激光杂志, 2011, 32(1): 29-31.
    [10]
    [11] Moharam M G, Gaylord T K. Rigorous coupled-wave analysis of planar-grating diffraction[J]. J Opt Soc Am, 1981, 71(7): 811-818.
    [12]
    [13] Moharam M G, Grann E B, Pommet D A, et al. Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings[J]. J Opt Soc Am A, 1995, 12(5): 1068-1076.
    [14]
    [15] Moharam M G, Pommet D A, Grann E B, et al. Stable implementation of the rigorous coupled-wave analysis for surface-relief gratings:enhanced transmittance matrix approach[J]. J Opt Soc Am A, 1995, 12(5): 1077-1086.
    [16]
    [17] Li L F, Haggans C W. Convergence of the coupled-wave method for metallic lamellar diffraction gratings[J]. J Opt Soc Am A, 1993, 10(6): 1184-1189.
    [18]
    [19]
    [20] Peng S, Morris G M. Efficient implementation of rigorous coupled-wave analysis for surface-relief gratings[J]. J Opt Soc Am A,1995, 12(5): 1087-1096.
    [21]
    [22] Lalanne P, Morris G M. Highly improved convergence of the coupled-wave method for TM polarization[J]. J Opt Soc Am A, 1996, 13(4): 779-784.
    [23] Li L F. Use of Fourier series in the analysis of discontinuous periodic structures[J]. J Opt Soc Am A, 1996, 13(9): 1870-1876.
    [24]
    [25] Lee W, Degertekin F L. Rigorous coupled-wave analysis of multilayered grating structures[J]. Journal of Lightwave Technology, 2004, 22(10): 2359-2363.
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Rigorous coupled wave analysis of grating-embedded multilayer structure conical diffraction

  • 1. School of Optoelectronics,Beijing Institute of Technology,Beijing 100081,China

Abstract: Based on rigorous coupled wave analysis, the models for grating-embedded multilayer structure planar diffraction were generalized to the case of conical diffraction. The proposed method can be used to calculate the light diffracted from the grating-embedded multilayer structure with arbitrary wavelength, polarization, azimuthal angle and incident angle. For the micromachined optoacoustic sensor, the convergence performance of the diffraction efficiencies of the reflected +1st order in conical diffraction was investigated. The simulations show that using a 4m grating period and TM (Transverse Magnetic) polarization, when the numbers of harmonics M(2n+1) are 67, 69 and 71, the diffraction efficiencies of the +1st order are 28.86%, 28.84% and 28.86%, respectively. Then the displacement sensitivity of the micromachined optoacoustic sensor was optimized. When the incident angle, the azimuthal angle and the grating period are 22, 10and 1 m, respectively, compared with the +1st diffracted orders of 4 m grating period, the displacement sensitivity of the 0th and +1st orders under TE and TM polarization was nearly doubled. It can be used to accurately monitor the metal membrane displacement induced by the acoustic pressure or electrostatic actuation voltage.

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