Zhang Wenwen, Qian Yuehong, Chen Qian, Gu Guohua. Performance parameters test of electron multiplying CCD[J]. Infrared and Laser Engineering, 2013, 42(12): 3390-3395.
| Citation:
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Zhang Wenwen, Qian Yuehong, Chen Qian, Gu Guohua. Performance parameters test of electron multiplying CCD[J]. Infrared and Laser Engineering, 2013, 42(12): 3390-3395.
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Performance parameters test of electron multiplying CCD
- 1.
School of Electronic Engineering & Photoelectric technology,Nanjing University of Science & Technology,Nanjing 210094,China
- Received Date: 2013-04-09
- Rev Recd Date:
2013-05-10
- Publish Date:
2013-12-25
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Abstract
The performance test of Electron multiplying CCD(EMCCD) is an important adjunct and design basis of electron multiplying CCD chip and the whole imaging system. In this paper, the working principles of EMCCD were introduced, and then the characteristic parameters of EMCCD was presented. Aiming at the problem of unit conversion in the process of testing, the concept of conversion gain was introduced.The parameters test of the electron multiplying CCD was proposed based on improved photon transfer technology, the EMCCD performance parameter testing system also was established. The system included a high stability and controllable standard tungsten lamp, optical system, the black box, data acquisition and processing system.These parameters were tested, such as convert gain, full well, multiplication gain,noise factor, readout noise, dark current noise and clock induced charge noise of Andor Luca camera.The experimental results are really good and agree with the device specifications .These also verify the feasibility and reliability of the test method.
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