Volume 43 Issue 1
Jan.  2014
Turn off MathJax
Article Contents

Zhu Jigui, Guo Tinghang, Zhang Tao, Yu Jinlong, Wang Ju, Wang Jing. Thermally-induced error of the length measurement method based on optoelectronic oscillators[J]. Infrared and Laser Engineering, 2014, 43(1): 254-259.
Citation: Zhu Jigui, Guo Tinghang, Zhang Tao, Yu Jinlong, Wang Ju, Wang Jing. Thermally-induced error of the length measurement method based on optoelectronic oscillators[J]. Infrared and Laser Engineering, 2014, 43(1): 254-259.

Thermally-induced error of the length measurement method based on optoelectronic oscillators

  • Received Date: 2013-05-17
  • Rev Recd Date: 2013-06-18
  • Publish Date: 2014-01-25
  • The length measurement method based on Optoelectronic Oscillator (OEO) introduces a free optical space, containing the measured length, into the optical cavity of OEO. The measured length is derived from the oscillation frequency corresponding to the cavity length. By virtue of the high sensitivity between oscillation frequency and group delay of the loop, this method promises high accuracy absolute length measurement at long range. However, long optical fiber, which is the high Q component of the cavity, is too sensitive to ambient temperature, leading to serious deterioration in accuracy and stability. In this paper, the influence of temperature variation was theoretically analyzed. The relation among thermally -induced error, temperature variation and length of optical fiber was established and analyzed, and optimization method of parameter was proposed. Experiments on optical fiber with different length and thermally-induced error were carried out. Experimental results consist with the error model, providing important basis for error compensation.
  • [1] Lam Duy Nguyen, Keitaro Nakatani, Bernard Journet. Refractive index measurement by using an optoelectronic oscillator [J]. IEEE Photonic Technology Letters, 2010, 22 (12): 857-859.
    [2]
    [3] Loparev A V, Belkin M E. Modeling a transducer based on an optoelectronic oscillator for precision measurements of the optico -physical parameters of different media [J]. Measurement Techniques, 2011, 53(11): 1236-1245.
    [4]
    [5] Steve Yao X, Lute Maleki. Optoelectronic microwave oscillator [J]. Opt Soc, 1996, 12(8): 1725-1735.
    [6]
    [7]
    [8] Eliyahu D, Sariri K, Kamran M, et al. Improving short and long term frequency stability of the opto-electronic oscillator[C]//IEEE Conference on Frequency Control Symposium and PDA Exhibition, 2002: 580-583.
    [9] Kaba M, Li H W, Daryoush A S, et al. Improving thermal stability of opto-electronic sscillaotrs [J]. Microwave Magazine, 2006, 7(4): 38-47.
    [10]
    [11]
    [12] Beck G, Bigot L, Bouwmans G. Benefits of photonic bandgap fibers for the thermal stabilization of optoelectronic oscillators [J]. IEEE Photonic Journal, 2012, 4(3): 789-794.
    [13] Shao Zhonghao, Mao Suofang. The testing of temperature characteristics of delay in optical fiber [J]. Journal of Nanjing Institute of Posts and Telecommunications, 1996, 16(3): 82- 85. (in Chinese) 邵钟浩, 毛锁方. 光纤传输时延温度特性的测量[J]. 南京 邮电学院学报, 1996, 16(3): 82-85.
    [14]
    [15] Musha T, Kamimura J, Nakazawa M. Optical phase fluctuations thermally induced in a single-mode optical fiber
    [16]
    [17] Yuan Libo. Effect of temperature and strain on fiber optic refractive index [J]. Acta Optica Sinica, 1997, 17(12): 919- 922. (in Chinese) 苑立波. 温度和应变对光纤折射率的影响[J]. 光学学报, 1997, 17(12): 919-922.
    [J]. Applied Optics, 1982, 21(4): 694-698.
    [19] Wang Jinqun. Factors of the air refractive index [D]. Hangzhou: Zhejiang University, 2006: 24-25. (in Chinese) 王金群. 大气折射率影响因素的研究[D]. 杭州: 浙江大学, 2006: 24-25.
    [20]
    [21]
    [22] Chen Jixin, Zhou Tao. Characteristic of phase noise of optoelectronic oscillator [J]. Infrared and Laser Engineering, 2008, 37(5): 863-865. (In Chinese) 陈吉欣, 周涛. 光电振荡器的相位噪声特性[J]. 红外与激 光工程, 2008, 37(5): 863-865.
    [23]
  • 加载中
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Article Metrics

Article views(354) PDF downloads(112) Cited by()

Related
Proportional views

Thermally-induced error of the length measurement method based on optoelectronic oscillators

  • 1. State Key Laboratory of Precision Measuring Technology and Instruments,Tianjin University,Tianjin 300072,China;
  • 2. School of Electronic and Information Engineering,Tianjin University,Tianjin 300072,China

Abstract: The length measurement method based on Optoelectronic Oscillator (OEO) introduces a free optical space, containing the measured length, into the optical cavity of OEO. The measured length is derived from the oscillation frequency corresponding to the cavity length. By virtue of the high sensitivity between oscillation frequency and group delay of the loop, this method promises high accuracy absolute length measurement at long range. However, long optical fiber, which is the high Q component of the cavity, is too sensitive to ambient temperature, leading to serious deterioration in accuracy and stability. In this paper, the influence of temperature variation was theoretically analyzed. The relation among thermally -induced error, temperature variation and length of optical fiber was established and analyzed, and optimization method of parameter was proposed. Experiments on optical fiber with different length and thermally-induced error were carried out. Experimental results consist with the error model, providing important basis for error compensation.

Reference (23)

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return